Metrology, inspection, and process control for microlithography XIV : 28 February - 2 March 2000, San Clara, California. pp.797-805, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Applications of digital image processing XXIII : 31 July - 3 August 2000, San Diego, USA. pp.688-699, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
ECLIM 2000 : 26th European Conference on Laser Interaction with Matter, 12-16 June, 2000, Prague, Czech Republic. pp.463-466, 2000. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Algorithms for multispectral and hyperspectral imagery II : 9-11 April 1996, Orlando, Florida. pp.218-228, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
A collection of technical papers : 16th AIAA Aerodynamic Decelerator Systems Technology Conference and Seminar, Boston, Massachusetts 21-24 May 2001. pp.375-380, 2001. Reston, VA. American Institute of Aeronautics and Astronautics
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AIAA Paper : AIAA Aerodynamic Decelerator Systems Technology Conference