1.

Conference Proceedings
Conference Proceedings
1. LIGHT SCATTERING MEASUREMENTS OF SURFACE ROUGHNESS IN MOLECULAR BEAM EPITAXY GROWTH OF GaAs
Lavoie, C. ; Nissen, M. K. ; Eisebitt, S. ; Johnson, S. R. ; Mackenzie, J. A. ; Tiedje, T.
Pub. info.: Diagnostic techniques for semiconductor materials processing : Symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A..  pp.119-,  1994.  Pittsburgh.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 324
2.

Conference Proceedings
Conference Proceedings
2. Temperature Dependence of the Optical Absorption Edge in Indium Phosphide
Beaudoin, M. ; Johnson, S. R. ; DeVries, A. J. G. ; Mohades-Kassai, A. ; Tiedje, T.
Pub. info.: Compound semiconductor electronics and photonics : symposium held April 8-10, 1996, San Francisco, California, U.S.A..  pp.367-,  1996.  Pittsburgh, Penn.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 421
3.

Conference Proceedings
Conference Proceedings
3. The Size-induced Metal-insulator Transition in Mesoscopic Conductors
Edwards, P. P. ; Johnson, S. R. ; Jones, M. O. ; Porch, A.
Pub. info.: Molecular nanowires and other quantum objects.  pp.329-342,  2004.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 148
4.

Conference Proceedings
Conference Proceedings
4. Photoluminescence refrigeration in semiconductors [6115-82]
Wang, J. B. ; Johnson, S. R. ; Ding, D. ; Yu, S. Q. ; Zhang, Y. H
Pub. info.: Physics and Simulation of Optoelectronic Devices XIV.  pp.61152C-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6115