1.

Conference Proceedings
Conference Proceedings
1. INVESTIGATION OF TEXTURE AND STRESS IN UNDOPED POLYSILICON FILMS
Huang, J. ; Krulevich, P. ; Johnson, G. C. ; Howe, R. T. ; Wenk, H. R.
Pub. info.: Polysilicon thin films and interfaces.  pp.201-206,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 182
2.

Conference Proceedings
Conference Proceedings
2. STRESS AND MICROSTRUCTURE IN LPCVD POLYCRYSTALLINE SILICON FILMS: EXPERIMENTAL RESULTS AND CLOSED FORM MODELING OF STRESSES
Krulevitch, P. ; Johnson, G. C. ; Howe, R. T.
Pub. info.: Thin films : stresses and mechanical properties III : symposium held December 2-5, 1991, Boston, Massachusetts, U.S.A..  pp.13-18,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 239
3.

Conference Proceedings
Conference Proceedings
3. Fracture Strength of Polycrystalline Silicon
Jones, P. T. ; Johnson, G. C. ; Howe, R. T.
Pub. info.: Microelectromechanical structures for materials research : symposium held April 15-16, 1998 , San Francisco, California, U.S.A..  pp.197-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 518
4.

Conference Proceedings
Conference Proceedings
4. Round-Robin Tests of Modulus and Strength of Polysilicon
Sharpe, W. N., Jr. ; Brown, S. ; Johnson, G. C. ; Knauss, W.
Pub. info.: Microelectromechanical structures for materials research : symposium held April 15-16, 1998 , San Francisco, California, U.S.A..  pp.57-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 518
5.

Conference Proceedings
Conference Proceedings
5. Curvature of a Cantilever Beam Subjected to an Equi-Biaxial Bending Moment
Krulevitch, P. ; Johnson, G. C.
Pub. info.: Microelectromechanical structures for materials research : symposium held April 15-16, 1998 , San Francisco, California, U.S.A..  pp.67-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 518
6.

Conference Proceedings
Conference Proceedings
6. Multilayer Microelectromechanical Structures For Material Property Characterization
Pratt, R. I. ; Johnson, G. C.
Pub. info.: Microelectromechanical structures for materials research : symposium held April 15-16, 1998 , San Francisco, California, U.S.A..  pp.15-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 518
7.

Conference Proceedings
Conference Proceedings
7. MECHANICAL CHARACTERIZATION OF THIN FILMS USING FULL-FIELD MEASUREMENT OF DIAPHRAGM DEFLECTION
Pratt, R. I. ; Johnson, G. C.
Pub. info.: Thin films : stresses and mechanical properties IV : symposium held April 12-16, 1993, San Francisco, California, U.S.A..  pp.115-,  1993.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 308
8.

Conference Proceedings
Conference Proceedings
8. STRESS-CORROSION CRACKING AND BLISTERING OF THIN POLYCRYSTALLINE SILICON FILMS IN HYDROFLUORIC ACID
Monk, D. J. ; Krulevitch, P. ; Howe, R. T. ; Johnson, G. C.
Pub. info.: Thin films : stresses and mechanical properties IV : symposium held April 12-16, 1993, San Francisco, California, U.S.A..  pp.641-,  1993.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 308
9.

Conference Proceedings
Conference Proceedings
9. A new method to measure the distance between the micro-device and the substrate [5852-115]
Kishimoto, S. ; Johnson, G. C.
Pub. info.: Third International Conference on Experimental Mechanics and Third Conference of the Asian Committee on Experimental Mechanics.  pp.724-728,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5852