1.

Conference Proceedings
Conference Proceedings
1. Aluminum Implantation Induced Linear Surface Faults in 4H-SiC
Wright, N. G. ; Vassilevski, K. V. ; Nikitina, I. ; Horsfall, A. B. ; Johnson, C. M. ; Bhatnagar, P. ; Tappin, P.
Pub. info.: Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy.  pp.613-616,  2005.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 483-485
2.

Conference Proceedings
Conference Proceedings
2. The Influence of Non-Stoichiometry on the Electrical Activation of n-Type Dopants in InP
Ridgway, M. C. ; Johnson, C. M. ; Kringhoj, P.
Pub. info.: Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.683-,  1995.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 378
3.

Conference Proceedings
Conference Proceedings
3. The effect of annealing on argon implanted edge terminations for 4H-SiC schottky diodes
Knights, A. P. ; Morrison, D. J. ; Wright, N. G. ; Johnson, C. M. ; O'Neill, A. G. ; Ortolland, S. ; Homewood, K. P. ; Lourenco, M. A. ; Gwilliam, R. M. ; Coleman, P. G.
Pub. info.: Wide-bandgap semiconductors for high-power, high-frequency, and high temperature applications--1999 : symposium held April 5-8, 1999, San Francisco, California, U.S.A..  pp.129-,  1999.  Warrendale, PA.  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 572
4.

Conference Proceedings
Conference Proceedings
4. Oxidation modeling for SiC
Wright, N. G. ; Johnson, C. M. ; O'Neill, A. G.
Pub. info.: Wide-bandgap semiconductors for high-power, high-frequency, and high temperature applications--1999 : symposium held April 5-8, 1999, San Francisco, California, U.S.A..  pp.135-,  1999.  Warrendale, PA.  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 572
5.

Conference Proceedings
Conference Proceedings
5. Effective Edge Termination Design in SiC VJFET
Bhatnagar, P. ; Horsfall, A. B. ; Wright, N. G. ; O'Neill, A, G. ; Vassilevski, K. V. ; Johnson, C. M.
Pub. info.: Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy.  pp.877-880,  2005.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 483-485
6.

Conference Proceedings
Conference Proceedings
6. Effect of Plasma Etching and Sacrificial Oxidation on 4H-SiC Schottky Barrier Diodes
Morrison, D. J. ; Pidduck, A. J. ; Moore, V. ; Wilding, P. J. ; Hilton, K. P. ; Uren, M. J. ; Johnson, C. M.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.1199-1202,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(2)
7.

Conference Proceedings
Conference Proceedings
7. TCAD Evaluation of Double Implanted 4H-SiC Power Bi polar Transistors
Johnson, C. M. ; Ortolland, S. ; Wright, N. G. ; O'Neill, A. G.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.1419-1422,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(2)
8.

Conference Proceedings
Conference Proceedings
8. Interactions Among Pitting Sites in Aluminum at Engineered Copper Particles
Missert, N. ; Copeland, R. G. ; Wall, F. D. ; Johnson, C. M. ; Barbour, J. C.
Pub. info.: Critical factors in localized corrosion IV : a symposium in honor of the 65th birthday of Hans Böhni : proceedings of the international symposium.  pp.421-428,  2002.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-24
9.

Conference Proceedings
Conference Proceedings
9. Phthalocyanine dye as an extremely photostable and highly fluorescent neor-lntrcred labeling reagent [6097-19]
Peng, X. ; Draney, D. R. ; Volcheck, W. M. ; Bashford, G. R. ; Lamb, D. T. ; Grone, D. L. ; Zhang, Y. ; Johnson, C. M.
Pub. info.: Optical Molecular Probes for Biomedical Applications.  pp.60970E-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6097
10.

Technical Paper
Technical Paper
10. Continuous czochralski growth. Development of advanced czochralski growth process to produce low cost 150 kg silicon ingots from a single crucible for technology readiness
Lane, R. L. ; Bezio, B. R. ; Boothroyde, J. ; Polsky, L. M. ; Johnson, C. M.
Pub. info.: NASA Technical Reports.  (NASA-CR-172965),  pp.1-134,  1982.  National Aeronautics and Space Administration