1.

Conference Proceedings

Conference Proceedings
Jing, H. ; Chen, X. ; Tao, Y. ; Zhu, B. ; Jin, F.
Pub. info.: Two- and three-dimensional methods for inspection and metrology III : 24-26 October, 2005, Boston, Massachusetts, USA.  pp.60000K-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6000
2.

Conference Proceedings

Conference Proceedings
Khurgin, J.B. ; Jin, F.
Pub. info.: Proceedings of the Fifth International Symposium on Quantum Confinement : nanostructures.  pp.297-311,  1998.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-19
3.

Conference Proceedings

Conference Proceedings
Mu, R. ; Henderson, D. O. ; Jin, F.
Pub. info.: Determining nanoscale physical properties of materials by microscopy and spectroscopy.  pp.243-,  1994.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 332
4.

Conference Proceedings

Conference Proceedings
Jin, F. ; Auner, G. W. ; Naik, R. ; Zatyko, P. ; Rao, U.
Pub. info.: III-V nitrides : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A..  pp.191-,  1997.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 449
5.

Conference Proceedings

Conference Proceedings
Li, Z. ; Cheng, X. ; Jin, F. ; Lin, G. ; Yang, X.
Pub. info.: Advances in optical data storage technology : 8-10 November, 2004, Beijing, China.  pp.194-204,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5643
6.

Conference Proceedings

Conference Proceedings
Trivedi, S.B. ; Jin, F. ; Kutcher, S.W. ; Wang, C.C. ; Jagannathan, G.V. ; Hoemmerich, U. ; Bluiett, A.G. ; Seo, J.T. ; Shah, R.T.
Pub. info.: Proceedings of the Eleventh International Workshop on the Physics of Semiconductor Devices : (December 11-15, 2001).  VOL-1  pp.138-145,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4746
7.

Conference Proceedings

Conference Proceedings
Feigley, R. ; Jin, F. ; Lorenzo, J. ; Soos, J. ; Trivedi, S.
Pub. info.: Chemical and biological standoff detection : 28-30 October 2003, Providence, Rhode Island, USA.  pp.96-103,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5268
8.

Conference Proceedings

Conference Proceedings
Lekova, M. ; Auner, G. W. ; Jin, F. ; Naik, R. ; Naik, V.
Pub. info.: III-V nitrides : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A..  pp.245-,  1997.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 449
9.

Conference Proceedings

Conference Proceedings
Sinha, P. G. ; Xiong, X. ; Jin, F. ; Trivedi, S. ; Prasad, N. S.
Pub. info.: Optical Diagnostics.  pp.58800I-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5880
10.

Conference Proceedings

Conference Proceedings
Jin, F. ; Jing, H. ; Qin, L. ; Chen, X. ; Tao, Y.
Pub. info.: Optics for Natural Resources, Agriculture, and Foods.  pp.638111-638111,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6381