1.

Conference Proceedings

Conference Proceedings
Jia,Y.B. ; Grimmeiss,H.G. ; Calleja,E.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.2  pp.1025-1030,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
2.

Conference Proceedings

Conference Proceedings
Han,Z.Y. ; Jia,Y.B. ; Grimmeiss,H.G.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.2  pp.1031-1034,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
3.

Conference Proceedings

Conference Proceedings
Jia,Y.B. ; Pan,O.G. ; Wang,L.C. ; Lo,P. ; Lee,S.K. ; Choi,J.Y. ; Shih,J.
Pub. info.: In-Line Methods and Monitors for Process and Yield Improvement.  pp.112-115,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3884