1.

Conference Proceedings

Conference Proceedings
Gaetz,T.J. ; Podgorski,W.A. ; Cohen,L.M. ; Freeman,M.D. ; Edgar,R.J. ; Jerius,D. ; Van Speybroeck,L.P. ; Zhao,P. ; Kolodziejczak,J.J. ; Weisskopf,M.C.
Pub. info.: Grazing incidence and multilayer X-ray optical systems : 27-29 July 1997, San Diego, California.  pp.77-88,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3113
2.

Conference Proceedings

Conference Proceedings
Van Speybroeck,L.P. ; Jerius,D. ; Edgar,R.J. ; Gaetz,T.J. ; Zhao,P. ; Reid,P.B.
Pub. info.: Grazing incidence and multilayer X-ray optical systems : 27-29 July 1997, San Diego, California.  pp.89-104,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3113
3.

Conference Proceedings

Conference Proceedings
Jerius,D. ; Donnelly,R.H. ; Tibbetts,M.S. ; Edgar,R.J. ; Gaetz,T.J. ; Schwartz,D.A. ; Speybroeck,L.P.Van ; Zhao,P.
Pub. info.: X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany.  pp.17-27,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4012
4.

Conference Proceedings

Conference Proceedings
Schwartz,D.A. ; David,L.P. ; Donnelly,R.H. ; Edgar,R.J. ; Gaetz,T.J. ; Graessle,D.E. ; Jerius,D. ; Juda,M. ; Kellogg,E.M. ; McNamara,B.R. ; Plucinsky,P.P. ; Speybroeck,L.P.Van ; Wargelin,B.J. ; Wolk,S. ; Dewey,D. ; Marshall,H.L. ; Schulz,N.S. ; Elsner,R.F. ; Kolodziejczak,J.J.
Pub. info.: X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany.  pp.28-40,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4012
5.

Conference Proceedings

Conference Proceedings
Gaetz,T.J. ; Jerius,D. ; Edgar,R.J. ; Speybroeck,L.P.Van ; Schwartz,D.A. ; Markevitch,M.L. ; Taylor,S.C. ; Schulz,N.S.
Pub. info.: X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany.  pp.41-52,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4012
6.

Conference Proceedings

Conference Proceedings
Kellogg,E.M. ; Cohen,L.M. ; Edgar,R.J. ; Evans,I.N. ; Freeman,M.D. ; Gaetz,T.J. ; Jerius,D. ; McDermott,W.C. ; McKinnon,P.J. ; Murray,S.S. ; Podgorski,W.A. ; Schwartz,D.A. ; Van Speybroeck,L.P. ; Wargelin,B.J. ; Zombeck,M.V. ; Weisskopf,M.C. ; Elsner,R.F. ; O'Dell,S.L. ; Tennant,A.F. ; Kolodziejczak,J.J.
Pub. info.: Grazing incidence and multilayer X-ray optical systems : 27-29 July 1997, San Diego, California.  pp.515-525,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3113