1.

Conference Proceedings
Conference Proceedings
1. Quantitative Two-Dimensional Carrier Mapping in Silicon Nanowire-Based Tunnel-Field Effect Transistors Using Scanning Spreading Resistance Microscopy
Andreas Schulze ; Thomas Hantschel ; Pierre Eyben ; Anne Vandooren ; Rita Rooyackers ; Jay Mody ; Anne S. Verhulst ; Wilfried Vandervorst
Pub. info.: Low-dimensional functional nanostructures : fabrication, characterization and applications : symposium held April 5-9, 2010, San Francisco, California.  pp.59-66,  2010.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 1258
2.

Conference Proceedings
Conference Proceedings
2. Scanning Spreading Resistance Microscopy for 3D-Carrier Profiling in FinFET-Based Structures
Jay Mody ; Pierre Eyben ; Wouter Polspoel ; Malgorzata Jurczak ; Wilfried Vandervorst
Pub. info.: Doping engineering for front-end processing : symposium held March 25-27, 2008, San Francisco, California, U.S.A..  pp.49-56,  2008.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 1070