Ben Houcine, K. ; Brun, G. ; Reolon, D. ; Jacquot, M. ; Verrier, I. ; Veillas, C.
Pub. info.:
Optical design and engineering : 30 September-3 October 2003, St. Etienne, France. pp.526-533, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Reolon, D. ; Brun, G. ; Ben Houcine, K. ; Verrier, I. ; Veillas, C. ; Jacquot, M.
Pub. info.:
Optical fabrication, testing, and metrology : 30 September-3 October 2003, St. Etienne, France. pp.381-390, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering