1.

Conference Proceedings
Conference Proceedings
1. Etch Rates of Ge, GaAs and InGaAs in Acids, Bases and Peroxide Based Mixtures
S. Sioncke ; D.P. Brunco ; M. Meuris ; O. Uwamahoro ; J. Van Steenbergen
Pub. info.: SiGe, Ge, and Related Compounds 3: Materials, Processing, and Devices.  pp.451-460,  2008.  Pennington, NJ.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 16(10)
2.

Conference Proceedings
Conference Proceedings
2. Characterization of Atomic-Beam Deposited GeO₁₋xNx/HfO₂ Stacks on Ge
M. Houssa ; T. Conard ; J. Van Steenbergen ; G. Mavrou ; Y. Panayiotatos ; T. Dimaulas ; M. Meuris ; M. Caymax ; M. Heyns ; G. Nicholas
Pub. info.: Physics and technology of high-k gate dielectrics III.  pp.9-16,  2006.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 1(5)