1.

Conference Proceedings
Conference Proceedings
1. Study of the Impact of Electron Traps on GaN HEMT Reliability
D. Katzer ; J. Mittereder ; S. Binari ; D. Storm ; J. Roussos ; P. Klein
Pub. info.: State-of-the-art program on compound semiconductors 45 (SOTAPOCS 45) and wide bandgap semiconductor materials and devices 7.  pp.151-160,  2006.  Pennington, N.J.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 3(5)
2.

Conference Proceedings
Conference Proceedings
2. Micro-Raman Studies of Thermal Stress Effects in GaN Heteroepitaxial Layers and Self-Heating Effects in AlGaN/GaN HEMT Structures
J. Kim ; J. A. Freitas ; J. Mittereder ; E. R. Glaser ; D. S. Katzer ; S. J. Pearton ; F. Ren ; S. Guo ; B. Albert
Pub. info.: State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XLIII) and Nitride and Wide Bandgap Semiconductors for Sensors, Photonics, and Electronics VI.  pp.129-129,  2006.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 1(2)