1.

Conference Proceedings
Conference Proceedings
1. Micro-Photoluminescence Mapping of Defect Structures in SiC Wafers
J. Hennessy ; T. Ryan
Pub. info.: Silicon carbide and related materials 2006 : ECSCRM 2006, Proceedings of the 6th European Conference on Silicon Carbide and Related Materials, Newcastle upon Tyne, UK, September 2006.  pp.383-386,  2007.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 556-557
2.

Conference Proceedings
Conference Proceedings
2. XRD and Photoluminescence Whole-Wafer Mapping of 4H-SiC Wafers
T. Ryan ; J. Hennessy ; C. Harrison ; S.Y. Wang ; G. Webster ; A. Majima
Pub. info.: Silicon carbide and related materials 2006 : ECSCRM 2006, Proceedings of the 6th European Conference on Silicon Carbide and Related Materials, Newcastle upon Tyne, UK, September 2006.  pp.299-302,  2007.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 556-557