J. Schaeffer ; N. V. Edwards ; R. Liu ; D. Roan ; B. Hradsky ; R. Gregory ; J. Kulik ; E. Duda ; L. Contreras ; J. Christiansen ; S. Zollner ; P. Tobin ; B.-Y. Nguyen ; R. Nieh ; M. Ramon ; R. Rao ; R. Hegde ; R. Rai ; J. Baker ; S. Voight
Pub. info.:
Physicas and technology of high-k gate dielectrics : proceedings of the International Symposium on High Dielectric Constant Materials : Materials Science, Processing, and Reliability, and Manufacturing Issues. pp.49-62, 2002. Pennington, NJ. Electrochemical Society
A.L. Cornelius ; B. Abeln ; D. Antonio ; J. Baker ; P.E. Kalita
Pub. info.:
THERMEC 2013 : Selected, peer reviewed papers from the 8th International Conference on PROCESSING & MANUFACTURING OF ADVANCED MATERIALS Processing, Fabrication, Properties, Applications, December 2-6, 2013, Las Vegas, USA. pp.1836-1838, 2014. Aedermannsdorf, Switzerland. Trans Tech Publications
K. Reifsnider ; F. Rabbi ; J. Baker ; J.M. Adkins ; Q. Liu
Pub. info.:
THERMEC 2013 : Selected, peer reviewed papers from the 8th International Conference on PROCESSING & MANUFACTURING OF ADVANCED MATERIALS Processing, Fabrication, Properties, Applications, December 2-6, 2013, Las Vegas, USA. pp.1560-1566, 2014. Aedermannsdorf, Switzerland. Trans Tech Publications
J. M. Ryan ; J. Baker ; J. R. Macri ; M. L. McConnell ; R. Carande
Pub. info.:
Sensors, and command, control, communications, and intelligence (C3I) technologies for homeland security and homeland defense VII : 17-20 March 2008, Orlando, Florida, USA. pp.694312-1-694312-9, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering