1.

Conference Proceedings

Conference Proceedings
Ittermann,B. ; Koschnick,F.K. ; Barry,W.A. ; Burnard,M.J. ; Watkins,G.D.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.423-428,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
2.

Conference Proceedings

Conference Proceedings
Frank,H.-P. ; Diehl,E. ; Ergezinger,K.-H. ; Fischer,B. ; Ittermann,B. ; Mai,F. ; Marbach,K. ; Weißenmayer,S. ; Welker,G. ; Ackermann,H. ; Stockman,H.-J.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.135-140,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
3.

Conference Proceedings

Conference Proceedings
Marbach,K. ; Ittermann,B. ; Fullgrabe,M. ; Heemeier,M. ; Kroll,F. ; Mai,F. ; Meier,P. ; Peters,D. ; H.Thieヲツ ; Ackermann,H. ; Stocknann,H.-J. ; Zeitz,W.-D. ; Wenisch,H. ; Hommel,D.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1395-1400,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
4.

Conference Proceedings

Conference Proceedings
Jeyanathan,L. ; Davies,G. ; Lightowlers,E.C. ; Singh,M. ; Sun,H.J. ; Ittermann,B. ; Ostapenko,S.S. ; Barry,W.A. ; Mason,P. ; Watkins,G.D.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.2  pp.1167-1172,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
5.

Conference Proceedings

Conference Proceedings
Fischer,B. ; Seelinger,W. ; Diehl,E. ; Ergezinger,K.-H. ; Frank,H.-P. ; Ittermann,B. ; Mai,F. ; Welker,G. ; Ackermann,H. ; Stockmann,H.-J.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.1  pp.269-272,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87