Ishimori, Y. ; Kawano, K. ; Ishizuka, M. ; Murahashi, M. ; Tamiya, E.
Pub. info.:
Environmental monitoring and remediation III : 28-30 October 2003, Providence, Rhode Island, USA. pp.86-93, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ishizuka, M. ; Nakagawa, S. ; Ishimori, Y. ; Kawano, K.
Pub. info.:
Environmental monitoring and remediation III : 28-30 October 2003, Providence, Rhode Island, USA. pp.94-100, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ishimori, Y. ; Kawano, K. ; Shinozaki, T. ; Mouri, M. ; Kase, T. ; Tamiya, E. ; Ishizuka, M.
Pub. info.:
Advanced environmental sensing technology II : 31 October-1 November, 2001, Newton, [Massachusetts] USA. pp.40-48, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Mouri, M. ; Ishimori, Y. ; Kawano, K. ; Uchida, H. ; Ishikawa, Y. ; Tamiya, E. ; Ishizuka, M.
Pub. info.:
Environmental monitoring and remediation III : 28-30 October 2003, Providence, Rhode Island, USA. pp.78-85, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering