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76 results

Conference Proceedings

1. ELECTRON-BEAM-INDUCED DAMAGE IN GaAs/AlGaAs HETEROSTRUCTURES

Tanaka, N. ; Kawanishi, H. ; Ishikawa, T.

Pub. info.:	Beam-solid interactions : fundamentals and applications : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A.. pp.99-104, 1993. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	279

Conference Proceedings

2. DOPING STUDY OF Se INTO A1GaAs LAYERS GROWN BY MBE, AND THEIR APPLICATION TO HEMT STRUCTURES

Maeda, T. ; Ishikawa, T. ; Kondo, K.

Pub. info.:	Advances in materials, processing, and devices in III-V compound semiconductors. pp.239-244, 1989. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	144

Conference Proceedings

3. BURIED QUANTUM WELL STRUCTURE FABRICATED BY IN SITU EB LITHOGRAPHY

Kawanishi, H. ; Sugimoto, Y. ; Ishikawa, T. ; Tanaka, N. ; Hidaka, H.

Pub. info.:	Photons and low energy particles in surface processing : symposium held Decmber[i.e. December] 3-6, 1991, Boston, Massachusetts, U.S.A.. pp.147-152, 1992. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	236

Conference Proceedings

4. Water Layer on Gold as Investigated by In Situ Simultaneous Measurement with IR-RAS and QCM

Sasaki, T. ; Itoh, J. ; Seo, M. ; Ishikawa, T.

Pub. info.:	Proceedings of the Symposium on Passivity and its Breakdown. pp.100-107, 1997. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	97-26

Conference Proceedings

5. Development of a figure correction method having spatial resolution close to 0.1 mm

Mori, Y. ; Yamauchi, K. ; Yamamura, K. ; Mimura, H. ; Sano, Y. ; Saito, A. ; Endo, K. ; Souvorov, A. ; Yabashi, M. ; Tamasaku, K. ; Ishikawa, T.

Pub. info.:	Advances in mirror technology for X-ray, EUV lithography, laser, and other applications : 7-8 August 2003, San Diego, California, USA. pp.105-111, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5193

Conference Proceedings

6. Fabrication technology of hard x-ray aspherical mirror optics and application to nanospectroscopy

Mori, Y. ; Yamauchi, K. ; Yamamura, K. ; Mimura, H. ; Sano, Y. ; Saito, A. ; Endo, K. ; Souvorov, A. ; Yabashi, M. ; Tamasaku, K. ; Ishikawa, T. ; Shimura, M. ; Ishizaka, Y.

Pub. info.:	Advances in mirror technology for X-ray, EUV lithography, laser, and other applications : 7-8 August 2003, San Diego, California, USA. pp.11-17, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5193

Conference Proceedings

7. Evaluation of a modern soft x-ray monochromator with high resolving power over 10,000 [6317-49]

Ohashi, H. ; Senba, Y. ; Ishiguro, E. ; Goto, S. ; Shin, S. ; Ishikawa, T.

Pub. info.:	Advances in X-ray/EUV optics, components, and applications : 14-16 August 2006, San Diego, California, USA. pp.63171A-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6317

Conference Proceedings

8. High-spatial-resolution scanning x-ray fluorescence microscope with Kirkpatrick-Baez mirrors [6317-48]

Matsuyama, S. ; Mimura, H. ; Shimura, M. ; Yumoto, H. ; Katagishi, K. ; Handa, S. ; Shibatani, A. ; Sano, Y. ; Yamamura, K. ; Nishino, Y. ; Tamasaku, K. ; Yabashi, M. ; Ishikawa, T. ; Yamauchi, K.

Pub. info.:	Advances in X-ray/EUV optics, components, and applications : 14-16 August 2006, San Diego, California, USA. pp.631719-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6317

Conference Proceedings

9. Wave-optical simulations for designing and evaluating hard x-ray reflective optics [6317-47]

Mimura, H. ; Matsuyama, S. ; Yumoto, H. ; Handa, S. ; Shibatani, A. ; Katagishi, K. ; Sano, Y. ; Nishino, Y. ; Yabashi, M. ; Tamasaku, K. ; Ishikawa, T. ; Yamauchi, K.

Pub. info.:	Advances in X-ray/EUV optics, components, and applications : 14-16 August 2006, San Diego, California, USA. pp.631718-631718, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6317

10.

Conference Proceedings

10. Results of x-ray mirror round-robin metrology measurements at the APS, ESRF, and SPring-8 optical metrology laboratories [5921-21]

Assoujfid, L. ; Rommeveaux, A. ; Ohashi, H. ; Yamauchi, K. ; Mimura, H. ; Qian, J. ; Hignette, O. ; Ishikawa, T. ; Morawe, C. ; Macrander, A. ; Khounsary, A. ; Goto, S.

Pub. info.:	Advances in metrology for x-ray and EUV optics : 2-3 August 2005, San Diego, California, USA. pp.59210J-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5921

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Author: Ishikawa, T.