Sanada, M. ; Tamada, O. ; Ishikawa, A. ; Kawai, A.
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Advances in resist technology and processing XXII : 28 February-2 March, 2005, San Jose, California, USA. pp.380-389, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Tamada, O. ; Sanada, M. ; Ishikawa, A. ; Niiyama, T. ; Kawai, A.
Pub. info.:
Advances in resist technology and processing XXII : 28 February-2 March, 2005, San Jose, California, USA. pp.400-407, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Kawai, A. ; Ishikawa, A. ; Niiyama, T. ; Harumoto, M. ; Tamada, O. ; Sanada, M.
Pub. info.:
Advances in resist technology and processing XXII : 28 February-2 March, 2005, San Jose, California, USA. pp.195-205, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Liliental-Weber, Zuzanna ; Ishikawa, A. ; Teriauchi, M. ; Tanaka, M.
Pub. info.:
Advances in surface and thin film diffraction : symposium held November 27-29, 1990, Boston, Massachusetts, U.S.A.. pp.183-188, 1991. Pittsburgh, Pa.. Materials Research Society
Liliental-Weber, Zuzanna ; Ishikawa, A. ; Teriauchi, M. ; Tanaka, M.
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Evolution of thin-film and surface microstructure : symposium held November 26-December 1, 1990, Boston, Massachusetts, U.S.A.. pp.305-310, 1991. Pittsburgh, Pa.. Materials Research Society
Plasmonics: Metallic Nanostructures and Their Optical Properties III. pp.59271E-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering