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55 results

Conference Proceedings

1. Proposal of the Thermal Equilibrium Model for SiC Hydrogen Etching Phenomena

Ishida, Y. ; Takahashi, T. ; Okumura, H. ; Arai, K. ; Kimura, K. ; Nakamura, K. ; Yoshida, S.

Pub. info.:	Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005. pp.211-214, 2006. Stafa-Zuerich. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	527-529

Conference Proceedings

2. Super-resolution x-ray imaging by CdTe discrete detector arrays [5922-33]

Aoki, T. ; Ishida, Y. ; Morii, H. ; Tomita, Y. ; Ohashi, G. ; Temmyo, J. ; Hatanaka, Y.

Pub. info.:	Hard X-ray and gamma-ray detector physics VII : 1-3 August 2005, San Diego, California. pp.59220T-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5922

Conference Proceedings

3. Evaluation of properties of various type CdTe hard x-ray detectors [5922-42]

Togami, A. ; Ishida, Y. ; Aoki, T. ; Hatanaka, Y. ; Temmyo, J.

Pub. info.:	Hard X-ray and gamma-ray detector physics VII : 1-3 August 2005, San Diego, California. pp.592210-592210, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5922

Conference Proceedings

4. Energy distinction type CdTe two-dimension x-ray imaging device [5922-41]

Furuhashi, D. ; Sakashita, D. ; Ishida, Y. ; Aoki, T. ; Tomita, Y. ; Hatanaka, Y. ; Temmyo, J.

Pub. info.:	Hard X-ray and gamma-ray detector physics VII : 1-3 August 2005, San Diego, California. pp.59220Z-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5922

Conference Proceedings

5. Coimplantation Effects of (C and Si)/Ga in 6H-SiC

Tanaka, Y. ; Kobayashi, N. ; Hasegawa, M. ; Ogura, M. ; Ishida, Y. ; Yoshida, S. ; Okumura, H. ; Tanoue, H.

Pub. info.:	Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999. pp.917-920, 2000. Zuerich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	338-342(2)

Conference Proceedings

6. Structural and Optical Characterization of High-Quality Cubic GaN Epilayers Grown on GaAs and 3C-SiC Substrates by Gas-Source MBE Using RHEED In Situ Monitoring

Okumura, H. ; Balakrishnan, K. ; Feuillet, G. ; Ohta, K. ; Hamaguchi, H. ; Chichibu, S. ; Ishida, Y. ; Yoshida, S.

Pub. info.:	III-V nitrides : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A.. pp.435-, 1997. Pittsburgh, PA. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	449

Conference Proceedings

7. Sensitive Detection of Defects in α and β SiC by Raman Scattering

Nakashima, S. ; Nakatake, Y. ; Ishida, Y. ; Takahashi, T. ; Okumura, H.

Pub. info.:	Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001. pp.629-632, 2002. Zuerich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	389-393

Conference Proceedings

8. Replication of Defects from 4H-SiC Wafer to Epitaxial Layer

Ohno, T. ; Yamaguchi, H. ; Kojima, K. ; Nishio, J. ; Masahara, K. ; Ishida, Y. ; Takahashi, T. ; Suzuki, T. ; Yoshida, S.

Pub. info.:	Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001. pp.447-450, 2002. Zuerich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	389-393

Conference Proceedings

9. Development of energy-discriminate CdTe imaging detector for hard x-ray

Aoki, T. ; Ishida, Y. ; Sakashita, D. ; Gnatyuk, V.A. ; Nakamura, A. ; Tomita, Y. ; Hatanaka, Y. ; Temmyo, J.

Pub. info.:	Hard X-Ray and Gamma-Ray Detector Physics VI. pp.196-205, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5540

10.

Conference Proceedings

10. Photoemission Spectroscopic Studies on Oxide/SiC Interfaces Formed by Dry and Pyrogenic Oxidation

Hijikata, Y. ; Yaguchi, H. ; Ishida, Y. ; Yoshikawa, M. ; Kamiya, T. ; Yoshida, S.

Pub. info.:	Silicon carbide and related materials 2003 : ICSCRM, 2003 : proceedings of the 10th International Conference on Silicon Carbide and Related Materials 2003, Lyon, France, October 5-10, 2003. pp.1341-1344, 2004. Uetikon-Zuerich. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	457-460

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Author: Ishida, Y.