Remote sensing for agriculture, ecosystems, and hydrology III : 17-19 September, 2001, Toulouse, France. pp.246-251, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Metrology, inspection, and process control for microlithography XII : 23-25 February 1998, San Clara, California. pp.336-345, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Laser resonators III : 26-28 January 2000, San Jose, California. pp.115-122, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Hyperspectral remote sensing of the land and atomosphere : 9-12 October 2000, Sendai, Japan. pp.153-163, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
First International Symposium on Laser Precision Microfabrication : 14-16 June 2000, Omiya, Saitama, Japan. pp.199-200, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Proceedings of ophthalmic technologies VI : 27-28 January 1996, San Jose, California. pp.139-143, 1996. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optoelectronic integrated circuits and packaging III : 28-29 January 1999, San Jose, California. pp.28-36, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
International Symposium on Polarization Analysis and Applications to Device Technology. pp.90-95, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering