1.

Conference Proceedings

Conference Proceedings
Kwanaka,J. ; Nishioka,H. ; Inoue,N. ; Kubota,Y. ; Ueda,K.
Pub. info.: XIII International Symposium on Gas Flow and Chemical Lasers and High-Power Laser Conference : 18-22 September 2000.  pp.381-384,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4184
2.

Conference Proceedings

Conference Proceedings
Yamanaka,Y. ; Tanahashi,K. ; Mikayama,T. ; Inoue,N. ; Mori,A.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.77-85,  2000.  Pennington, N.J., Bellingham, Wash..  Electrochemical Society — SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4218
3.

Conference Proceedings

Conference Proceedings
Harada,H. ; Tanahashi,K. ; Koukitsu,A. ; Mikayama,T. ; Inoue,N.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.97-102,  2000.  Pennington, N.J., Bellingham, Wash..  Electrochemical Society — SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4218
4.

Conference Proceedings

Conference Proceedings
Ikuta,K. ; Yokoyarna,H. ; Inoue,N.
Pub. info.: Shallow Impurities in Semiconductors : Proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August, 1992.  pp.291-296,  1993.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 117-118
5.

Conference Proceedings

Conference Proceedings
Kimoto,T. ; Itoh,A. ; Inoue,N. ; Takemura,O. ; Yamamoto,T. ; Nakajima,T. ; Matsunami,H.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part2  pp.675-680,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
6.

Conference Proceedings

Conference Proceedings
Shinohara,M. ; Yokoyama,H. ; Inoue,N.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.555-560,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
7.

Conference Proceedings

Conference Proceedings
Yano,H. ; Inoue,N. ; Kimoto,T. ; Matsunami,H.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part2  pp.841-844,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
8.

Conference Proceedings

Conference Proceedings
Inoue,N. ; Ozaki,T. ; Monnaka,T. ; Kashiwabara,S. ; Fujimoto,R.
Pub. info.: Excimer lasers, optics, and applications : 12-13 February 1997, San Jose, California.  pp.66-71,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2992
9.

Technical Paper

Technical Paper
Shirasawa,H. ; Mimura,K. ; Yokoi,T. ; Shibata,Z. ; Inoue,N.
Pub. info.: Sheet Metal and Stamping Symposium.  pp.87-92,  1993.  Society of Automotive Engineering, Inc.
Title of ser.: SAE special publication
Ser. no.: SP-944