Poirier, M. ; Ilias, S. ; Thibault, S. ; Topart, P. ; Jerominek, H.
Pub. info.:
Advances in optical thin films : 30 September-3 October 2003, St. Etienne, France. pp.471-482, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Thibault, S. ; Poirier, M. ; Ilias, S. ; Levesque, L. ; Saddlemye, L. ; Robert, S. ; Crabtree, D.
Pub. info.:
Optical fabrication, metrology, and material advancements for telescopes : 24-25 June 2004, Glasgow, Scotland, United Kingdom. pp.254-265, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ilias, S. ; Pascallon, J. ; Stambouli, V. ; Bouchier, D. ; Nouet, G.
Pub. info.:
Polycrystalline thin films : structure, texture, properties and applications III : symposium held March 31-April 3, 1997, San Francisco, California, U.S.A.. pp.173-, 1997. Pittsburgh, Pa.. MRS - Materials Research Society
Ilias, S. ; Picard, F. ; Larouche, C. ; Jerominek, H.
Pub. info.:
Micromachining and Microfabrication Process Technology XI. pp.610907-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering