1.

Conference Proceedings
Conference Proceedings
1. An Easy Method to Measure the Damaged Thickness of Low-k Film after Ash Process
C. Shim ; H. Lim ; S. Jung ; I. Shin ; K. Park ; J. Whang ; H. Lee ; J. Kim ; J. Han ; K. Kim
Pub. info.: Dielectrics for nanosystems II: materials science, processing, reliability, and manufacturing.  pp.243-254,  2006.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 2(1)
2.

Conference Proceedings
Conference Proceedings
2. Development of an internet-based water-1evel monitoring and measuring system using CCD camera
I. Shin ; J. Kim ; S.-G. Lee
Pub. info.: ICMIT 2007, mechatronics, MEMS, and smart materials.  2  pp.67944Q-1-67944Q-6,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6794