1.

Conference Proceedings
Conference Proceedings
1. Electrically Active Interface Defects in Si/SiO2 and Si(100)/HfO2 Structures
Hurley, P.K. ; O'Sullivan, B.J.
Pub. info.: Silicon nitride, silicon dioxide thin insulating films, and other emerging dieletrics VIII : proceedings of the international symposium.  pp.3-18,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-01
2.

Conference Proceedings
Conference Proceedings
2. HfO2 Films Obtained By Injection MOCVD
Leedham, T.J. ; Davies, H.O. ; Jones, A.C. ; O'Sullivan, B.J. ; Mondreau, M. ; Hurley, P.K. ; Fang, Q. ; Boyd, I.W.
Pub. info.: Chemical vapor deposition XVI and EUROCVD 14 : proceedings of the international symposium.  pp.907-914,  2003.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-8
3.

Conference Proceedings
Conference Proceedings
3. Optical characterization of high-k dielectrics HfO2 thin films obtained by MOCVD
Modreanu, M. ; Hurley, P.K. ; O'Sullivan, B.J. ; O'Looney, B. ; Senateur, J.-P. ; Rousell, H. ; Rousell, F. ; Audier, M. ; Dubourdieu, C. ; Boyd, I.W. ; Fang, Q. ; Leedham, T.L. ; Rushworth, S.A. ; Jones, A.C. ; Davies, H.O. ; Jimenez, C.
Pub. info.: Opto-Ireland 2002: Optics and Photonics Technologies and Applications.  Part Two  pp.1236-1246,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4876