1.

Conference Proceedings

Conference Proceedings
Humphreys, T.P. ; Jeon, Hyeongtag ; Nemanich, R.J. ; Posthill, J.B. ; Rudder, R.A. ; Malta, D.P. ; Hudson, G.C. ; Markunas, R.J. ; Hunn, J.D. ; Parikh, N.R.
Pub. info.: Evolution of thin-film and surface microstructure : symposium held November 26-December 1, 1990, Boston, Massachusetts, U.S.A..  pp.463-468,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 202
2.

Conference Proceedings

Conference Proceedings
Sandhu, G.S. ; Liu, B. ; Parikh, N.R. ; Hunn, J.D. ; Swanson, M.L. ; Wichert, Th. ; Deicher, M. ; Skudlik, H. ; Lennard, W.N. ; Mitchell, I.V.
Pub. info.: Diamond, silicon carbide, and related wide bandgap semiconductors : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.189-194,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 162
3.

Conference Proceedings

Conference Proceedings
Price, J.R. ; Hylton, K.W. ; Tobin, K.W., Jr. ; Bingham, P.R. ; Hunn, J.D. ; Haines, J.R.
Pub. info.: Sixth International Conference on Quality Control by Artificial Vision.  pp.476-484,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5132
4.

Conference Proceedings

Conference Proceedings
Price, J.R. ; Hunn, J.D.
Pub. info.: Machine Vision Applications in Industrial Inspection XII.  pp.137-149,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5303