1.

Conference Proceedings
Conference Proceedings
1. Design for a GeV/m laser-driven electron accelerator
Huang,Y.-C. ; Byer,R.L.
Pub. info.: Generation, Amplification, and Measurement of Ultrashort Laser Pulses III.  pp.210-219,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2701
2.

Conference Proceedings
Conference Proceedings
2. Chrome etch for <0.13μm advanced reticle production
Buie,M.J. ; Stoehr,B. ; Huang,Y.-C.
Pub. info.: 21st Annual BACUS Symposium on Photomask Technology.  4562  pp.633-640,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4562
3.

Conference Proceedings
Conference Proceedings
3. Extended chamber matching and repeatability study for chrome etch
Huang,Y.-C. ; Buie,M.J. ; Stoehr,B. ; Buxbaum,A. ; Ruhl,G.
Pub. info.: 21st Annual BACUS Symposium on Photomask Technology.  4562  pp.624-632,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4562
4.

Conference Proceedings
Conference Proceedings
4. Femtosecond carrier dynamics in GaN
Sun,C.-K. ; Liang,J.-C. ; Huang,Y.-L. ; Huang,Y.-C. ; Yu,X.-Y. ; Keller,S. ; DenBaars,S.P.
Pub. info.: Ultrafast Phenomena in Semiconductors V.  pp.1-8,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4280
5.

Conference Proceedings
Conference Proceedings
5. Process-induced damage to SRAM poly-load resistance during photoresist ashing in H2O plasma
Chang,K.-H. ; Huang,Y.-C. ; Lin,T.-H. ; Chang,C.-R.
Pub. info.: Microelectronic Manufacturing Yield, Reliability, and Failure Analysis.  pp.276-283,  1995.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2635