1.

Conference Proceedings

Conference Proceedings
Huang,Y. ; Huang,L. ; Zhao,C.
Pub. info.: Proceedings of the IMAC-XIX : a conference on structural dynamics, February 5-8, 2001, Hyatt Orlando Kissimmee, Florida.  4359  pp.1751-1757,  2001.  Bethel, CT.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4359
2.

Conference Proceedings

Conference Proceedings
Chen,D. ; Huang,Y. ; Shen,Z. ; Li,J. ; Geng,J.
Pub. info.: Multispectral and hyperspectral image acquisition and processing : 22-24 2001, Wuhan, China.  pp.265-268,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4548
3.

Conference Proceedings

Conference Proceedings
Wu,D. ; Huang,Y. ; Chen,X. ; Yu,C.
Pub. info.: Data mining and applications : 23-24 October 2001, Wuhan, China.  pp.128-132,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4556
4.

Conference Proceedings

Conference Proceedings
Al-Nuaimy,W. ; Huang,Y. ; Eriksen,A. ; Nguyen,V.T.
Pub. info.: Subsurface and surface sensing technologies and applications III : 30 July-1 August 2001, San Diego, USA.  pp.327-335,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4491
5.

Conference Proceedings

Conference Proceedings
Zhai,J. ; Schroeck,S. ; Huang,Y. ; Messner,W.C. ; Stancil,D.D. ; Schlesinger,T.E.
Pub. info.: Optical scanning : design and applications : 21-22 July 1999, Denver, Colorado.  pp.194-201,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3787
6.

Conference Proceedings

Conference Proceedings
Huang,Y. ; Lu,H.
Pub. info.: Proceedings of the 17th International Modal Analysis Conference February 8-11, 1999 Hyatt Orlando Hotel Kissimmee, Florida.  Part1  pp.660-663,  1999.  Bethel, CT.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3727
7.

Conference Proceedings

Conference Proceedings
Liu,D. ; Huang,Y. ; Huang,D.
Pub. info.: Advanced photonic sensors and applications : 30 November-3 December 1999, Singapore.  pp.180-186,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3897
8.

Conference Proceedings

Conference Proceedings
Zhai,J. ; Huang,Y. ; Schroeck,S. ; Messner,W.C. ; Schlesinger,T.E. ; Stancil,D.D.
Pub. info.: ISOM/ODS '99 : joint international symposium on Optical Memory and Optical Data Strage 1999, 11-15 July 1999 Sheraton Kauai Resort, Koloa, Howaii.  pp.252-254,  1999.  Bellingham, Washington.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3864
9.

Conference Proceedings

Conference Proceedings
Wan,M. ; Ou,H. ; Liu,X. ; Chen,X. ; Li,N. ; Lu,W. ; Shen,S.C. ; Wang,W. ; Huang,Y. ; Zhou,J.
Pub. info.: Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China.  pp.426-428,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3175
10.

Conference Proceedings

Conference Proceedings
Fan,Z. ; Ni,J. ; Huang,Y. ; Zhu,X.
Pub. info.: Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II : 29-30 January 1998, San Jose, California.  pp.180-183,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3275