Optical information processing technology : 16-18 October 2002, Shanghai, China. pp.436-441, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Kim, W. ; Mitra, S. ; Li, X. ; Prociw, L. ; Hu, T.
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A collection of technical papers : 1st International Energy Conversion Engineering Conference, Portsmouth, Virginia, 17-21 August 2003. pp.308-318, 2003. American Institute of Aeronautics and Astronautics
A collection of technical papers : 1st International Energy Conversion Engineering Conference, Portsmouth, Virginia, 17-21 August 2003. pp.287-297, 2003. American Institute of Aeronautics and Astronautics
Metrology, Inspection, and Process Control for Microlithography XVII. 1 pp.191-199, 2003. Bellingham, WA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Jones, R.L. ; Hu, T. ; Soles, C.L. ; Lin, E.K. ; Wu, W.- ; Casa, D.M. ; Mahorowala, A.
Pub. info.:
Metrology, Inspection, and Process Control for Microlithography XVIII. pp.191-198, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering