1.

Conference Proceedings

Conference Proceedings
Hao,M.C. ; Hsu,M. ; Dayal,U. ; Krug,A.
Pub. info.: Visual data exploration and analysis VII : 24-26 January 2000, San Jose, California.  pp.73-83,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3960
2.

Conference Proceedings

Conference Proceedings
Hsu,S. ; Shi,X. ; Hsu,M. ; Corcoran,N.P. ; Chen,J.F. ; Desai,S. ; Sherrill,M.J. ; Tseng,Y.C. ; Chang,H.A. ; Kao,J.F. ; Tseng,A. ; Liu,W.J. ; Chen,A. ; Lin,A. ; Kujten,J.P. ; Jacobs,E. ; Verhappen,A.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology VIII.  pp.172-185,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4409
3.

Conference Proceedings

Conference Proceedings
Hao,M.C. ; Hsu,M. ; Dayal,U. ; Wei,S.F. ; Sprenger,T. ; Holenstein,T.
Pub. info.: Visual Data Exploration and Analysis VIII.  pp.227-233,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4302
4.

Conference Proceedings

Conference Proceedings
Shi,X. ; Hsu,S. ; Chen,F. ; Hsu,M. ; Socha,R.J. ; Dusa,M.V.
Pub. info.: 21st Annual BACUS Symposium on Photomask Technology.  4562  pp.968-979,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4562