1.

Conference Proceedings
Conference Proceedings
1. Raw wafer material control to eliminate low yield
Hsu,C.F. ; Chang,W.C. ; Yeh,W.K. ; Lin,S.
Pub. info.: Process and equipment control in microelectronic manufacturing : 19-20 May 1999, Edinburgh, Scotland.  pp.43-50,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3742
2.

Conference Proceedings
Conference Proceedings
2. Volatile defect formation and polysilicon residue elimination
Hsu,C.F.
Pub. info.: Process and equipment control in microelectronic manufacturing II : 30-31 May, 2001, Edinburgh, UK.  pp.131-141,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4405
3.

Conference Proceedings
Conference Proceedings
3. Low-yield issue in IDDQ failure caused by the scrubber clean at SOG-CUR process stage
Hsu,C.F. ; Chang,W.C. ; Lin,C.C. ; Hiang,C.C.
Pub. info.: Process and equipment control in microelectronic manufacturing II : 30-31 May, 2001, Edinburgh, UK.  pp.17-24,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4405
4.

Conference Proceedings
Conference Proceedings
4. Coulomb enhancement CdZnSe single quantum well lasers
Hsu,C.F. ; Zory,P.S. ; Rees,P. ; Haase,M.
Pub. info.: In-Plane Semiconductor Lasers: from Ultraviolet to Midinfrared.  pp.106-116,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3001
5.

Conference Proceedings
Conference Proceedings
5. Intersubband laser design using a quantum box array
Hsu,C.F. ; O,J.S. ; Zory,P.S. ; Botez,D.
Pub. info.: In-Plane Semiconductor Lasers: from Ultraviolet to Midinfrared.  pp.271-281,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3001
6.

Conference Proceedings
Conference Proceedings
6. Internal quantum effeciency measurements of GaInP quantum well laser material using liquid contact luminescence
Hsu,C.F. ; Largent,C.C. ; O,J.S. ; Young,C.L. ; Zory,P.S. ; Bour,D.P.
Pub. info.: Laser Diodes and Applications II.  pp.136-143,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2682
7.

Conference Proceedings
Conference Proceedings
7. Novel method to eliminate SOG-etching-back-induced random particle
Hsu,C.F. ; Chang,C.H. ; Yu,M.K. ; Peng,Y.S.
Pub. info.: Process, Equipment, and Materials Control in Integrated Circuit Manufacturing IV.  pp.272-280,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3507