1.

Conference Proceedings
Conference Proceedings
1. High Performance Buried Silicon-Germanium Channel PMOST Fabricated Using Rapid Thermal Processing and Shallow Trench Isolation
Tweet, D.J ; Hsu, S.T. ; Evans, D.R. ; Ulrich, B. ; Ono, Y. ; Stecker, L.
Pub. info.: Rapid thermal and other short-time processing technologies : proceedings of the international symposium.  pp.321-328,  2000.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-9
2.

Conference Proceedings
Conference Proceedings
2. High Thermal Stability Ni/Co Silicide on SiGe for Raised Source/Drain Structures
Tweet, D.J. ; Maa, J.S. ; Hsu, S.T.
Pub. info.: Rapid thermal and other short-time processing technologies II : proceedings of the international symposium.  pp.363-370,  2001.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-9
3.

Conference Proceedings
Conference Proceedings
3. Fabrication of Strained Silicon on Insulator (SSOI) by Direct Wafer Bonding Using Thin Relaxed SiGe Film as Virtual Substrate
Lee, J.J. ; Maa, J.S. ; Tweet, D.J.. ; Hsu, S.T.
Pub. info.: High-mobility group-IV materials and devices : symposium held April 13-15, 2004, San Francisco, California, U.S.A..  pp.77-82,  2004.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 809
4.

Conference Proceedings
Conference Proceedings
4. Thermal Stability of Organic Interlayer with Low Dielectric Constant
Hara, T. ; Takasoh, J. ; Yang, H. ; Tweet, D.J. ; Nguyen, T. ; Ma, Y. ; Evans, D.R. ; Hsu, S.T.
Pub. info.: Dielectric material integration for microelectronics.  pp.79-87,  1998.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-3
5.

Conference Proceedings
Conference Proceedings
5. Electrical Characteristics of CVD Copper Interconnects and Vias
Nguyen, T. ; Ono, Y. ; Evans, D.R. ; Senzaki, Y. ; Kobayashi, M. ; Charmeski, L.J. ; Ulrich, B.D. ; Hsu, S.T.
Pub. info.: Proceedings of the Symposium on Interconnect and Contact Metallization.  pp.120-128,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-31