Kanter, E. ; Walker, R. ; Marion, S. ; Hoyer, P. ; Barton, J. K.
Pub. info.:
Optical coherence tomography and coherence techniques II : 12-16 June 2005, Munich, Germany. pp.58610P-, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Structure and properties of multilayered thin films : symposium held April 17-19, 1995, San Francisco, California, U.S.A.. pp.147-, 1995. Pittsburgh, Pa.. MRS - Materials Research Society