1.

Conference Proceedings
Conference Proceedings
1. Characterization of ultra thin SOI and SSOI substrates: defect and strain analysis Invited
Bedell, S.W. ; Hovel, H. ; Domenicucci, A. ; Fogel, K. ; Reznicek, A. ; Sadana, D.K.
Pub. info.: Silicon-on-insulator technology and devices XII : proceedings of the international symposium.  pp.345-356,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-03
2.

Conference Proceedings
Conference Proceedings
2. Strain Engineering for Si CMOS Technology (Invited paper)
Sadana, D. K. ; Bedell, S. W. ; Reznicek, A. ; de Souza, J.P. ; Fogel, K. ; Hovel, H.
Pub. info.: ULSI Process Integration : proceedings of the International Symposium.  pp.360-384,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-06
3.

Conference Proceedings
Conference Proceedings
3. Status of 300 mm SOI material: comparisons with 200 mm
Hovel, H. ; Alnionte, M. ; Tsai, P. ; Lee, J.D. ; Maurer, S. ; Kleinhenz, R. ; Schepis, D. ; Murphy, R. ; Ronsheim, P. ; Domemcucci, A. ; Rettinger, J. ; Sadana, D.
Pub. info.: Silicon-on-insulator technology and devices XI : proceedings of the international symposium.  pp.75-80,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-5
4.

Conference Proceedings
Conference Proceedings
4. Carrier lifetimes In SOI material
Hovel, H.
Pub. info.: Silicon-on-insulator technology and devices XI : proceedings of the international symposium.  pp.487-492,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-5