Canham, L. T. ; Reeves, C. L. ; Wallis, D. J. ; Newey, J. P. ; Houlton, M. R. ; Sapsford, G. J. ; Godfrey, R. E. ; Loni, A. ; Simons, A. J. ; Cox, T. I. ; Ward, M. C. L.
Pub. info.:
Advances in microcrystalline and nanocrystalline semiconductors, 1996 : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A.. pp.579-, 1997. Pittsburgh, Pa.. MRS - Materials Research Society
Carline, R. T. ; Leong, W. Y. ; Cullis, A. G. ; Houlton, M. R. ; Hope, D. A.
Pub. info.:
Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A.. pp.359-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society