1.

Conference Proceedings
Conference Proceedings
1. An instrument for surface roughness measurement of optical thin films
Hou, H. ; Yi, K. ; Shao, J. ; Fan, Z.
Pub. info.: Optical design and testing II : 8-12 November 2004, Beijing, China.  pp.638-641,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5638
2.

Conference Proceedings
Conference Proceedings
2. Advanced Fabrication Technologies for Nano-Electronics
Simmons, J.A. ; Sherwin, M.E. ; Weckwerth, M.V. ; Harff, N.E. ; Eiles, T.M. ; Baca, W.E. ; Hou, H. ; Hammons, B.E.
Pub. info.: Proceedings of the Twenty-fourth State-of-the-Art Program on Compound Semiconductors.  pp.186-202,  1996.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 96-2
3.

Conference Proceedings
Conference Proceedings
3. Atomic-Scale Computer Simulation of Mixture Precipitation Mechanism for Ni75AlxV25-x Alloy
Zhao, Y. H. ; Ju, D. Y. ; Hou, H.
Pub. info.: PRICM 5 : the Fifth Pacific Rim International Conference on Advanced Materials and Processing, November 2-5, 2004, Beijing, China.  pp.3115-3118,  2005.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 475-479(4)
4.

Conference Proceedings
Conference Proceedings
4. ECR Etching of GaP, GaAs, InP, and InGaAs in Cl2/Ar, Cl2/N2, BCl3/Ar, and BCl3/N2
Shul, R. J. ; Baca, A. G. ; Rieger, D. J. ; Hou, H. ; Pearton, S. J. ; Ren, F.
Pub. info.: Compound semiconductor electronics and photonics : symposium held April 8-10, 1996, San Francisco, California, U.S.A..  pp.245-,  1996.  Pittsburgh, Penn.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 421
5.

Conference Proceedings
Conference Proceedings
5. Dual-channel concave-shape optical coupling liquid sensing system [6150-63]
Yang, J. ; Hou, H. ; Zhang, M. ; Reisch, R.
Pub. info.: 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment.  pp.61503K-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6150