1.

Conference Proceedings
Conference Proceedings
1. Concentration and Depth Measurements of Boron in Semiconductor Materials Using Neutron Depth Profiling
Unlu, K. ; Wehring, B.W. ; Hossain, T.Z. ; Lowell, J.K.
Pub. info.: Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices.  pp.458-469,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-12
2.

Conference Proceedings
Conference Proceedings
2. *THE MEASUREMENT OF BORON AT SILICON WAFER SURFACES BY NEUTRON DEPTH PROFILING
Downing, R.G. ; Lavine, J.P. ; Hossain, T.Z. ; Russell, J.B. ; Zenner, G.P.
Pub. info.: Neutron scattering for materials science : symposium held November 27-30, 1989, Boston, Massachusetts, U.S.A..  pp.323-330,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 166