1.

Conference Proceedings
Conference Proceedings
1. Electromigration Characterization for Multilevel Metallizations Using Textured AlCu
Ting, Larry M. ; Hong, Qi-Zhong
Pub. info.: Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A..  pp.75-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 428
2.

Conference Proceedings
Conference Proceedings
2. DESIGNING AND BUILDING RELIABILITY INTO VLSI INTERCONNECT SYSTEMS
Graas, Carole D. ; Hong, Qi-Zhong ; Ting, Larry L.
Pub. info.: Advanced metallization for devices and circuits--science, technology, and manufacturability : symposium held April 4-8, 1994, San Francisco, California, U.S.A..  pp.71-,  1994.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 337