1.

Conference Proceedings
Conference Proceedings
1. Exchange in phosphorus donor spin based quantum computers
Wellard, C. J. ; Hollenberg, L. C. L.
Pub. info.: Micro- and Nanotechnology: Materials, Processes, Packaging, and Systems II.  pp.94-101,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5650
2.

Conference Proceedings
Conference Proceedings
2. Fast donor-based electron spin quantum computing
Hill, C. D. ; Hollenberg, L. C. L. ; Fawler, A. G ; Wellard, C. J. ; Greentree, A. D. ; Goan, H.-S.
Pub. info.: Micro- and Nanotechnology: Materials, Processes, Packaging, and Systems II.  pp.44-54,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5650
3.

Conference Proceedings
Conference Proceedings
3. Single-spin detection and read-out for the solid-state quantum computer via resonant techniques
Testolin, M. J. ; Hollenberg, L. C. L. ; Greentree, A. D. ; Wellard, C. J.
Pub. info.: Micro- and Nanotechnology: Materials, Processes, Packaging, and Systems II.  pp.516-526,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5650
4.

Conference Proceedings
Conference Proceedings
4. Investigating the practical implementation of Shor's alagorithm
Devitt, S. J. ; Fowler, A. G. ; Hollenberg, L. C. L.
Pub. info.: Micro- and Nanotechnology: Materials, Processes, Packaging, and Systems II.  pp.483-494,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5650
5.

Conference Proceedings
Conference Proceedings
5. Optimizing single-electron transistors as electrometers for high-precision electrometry of charge on quantum dots
Conrad, V. I. ; Greentree, A. D. ; Jamieson, D. N. ; Hollenberg, L. C. L.
Pub. info.: Micro- and Nanotechnology: Materials, Processes, Packaging, and Systems II.  pp.536-547,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5650
6.

Conference Proceedings
Conference Proceedings
6. Measuring decoherence properties of charge qubits using buried donor cellular automata
Cole, J. H. ; Greentree, A. D. ; Wellard, C. J. ; Hollenberg, L. C. L. ; Prawer, S.
Pub. info.: Micro- and Nanotechnology: Materials, Processes, Packaging, and Systems II.  pp.504-515,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5650
7.

Conference Proceedings
Conference Proceedings
7. Constructing Steane code fault-tolerant gates
Fowler, A. G. ; Devitt, S. J. ; Hollenberg, L. C. L.
Pub. info.: Micro- and Nanotechnology: Materials, Processes, Packaging, and Systems II.  pp.557-569,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5650
8.

Conference Proceedings
Conference Proceedings
8. Calculation of the exchange coupling in Si:P donor systems
Starling, T. R. ; Wellard, C. J. ; Quiney, H. M. ; Haig, W. ; Hollenberg, L. C. L.
Pub. info.: Micro- and Nanotechnology: Materials, Processes, Packaging, and Systems II.  pp.495-503,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5650
9.

Conference Proceedings
Conference Proceedings
9. Dephasing of charge qubits in the presence of charge traps
Ang, J. C. ; Wellard, C. J. ; Hollenberg, L. C. L.
Pub. info.: Micro- and Nanotechnology: Materials, Processes, Packaging, and Systems II.  pp.527-535,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5650