1.

Conference Proceedings
Conference Proceedings
1. Measuring the Adhesion of Diamond Thin Films to Substrates Using the Blister Test
Sizemore, Jim ; Hohlfelder, R. J. ; Vlassak, J. J. ; Nix, W. D.
Pub. info.: Mechanical behavior of diamond and other forms of carbon : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.197-208,  1995.  Pittsburgh.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 383
2.

Conference Proceedings
Conference Proceedings
2. Novel x-ray imaging diagnostics of high-energy nanosecond pulse accelerators (Invited Paper)
Smith, G. W. ; Beutler, D. E. ; Bell, J. D. ; Seymour, C. L. G. ; Hohlfelder, R. J. ; Gallegos, R. R. ; Dudley, J.
Pub. info.: 26th International Congress on High-Speed Photography and Photonics : 20-24 September 2004, Alexandria, Virginia, USA.  pp.559-570,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5580
3.

Conference Proceedings
Conference Proceedings
3. Tensile properties of amorphous diamond films
LaVan, D. A. ; Hohlfelder, R. J. ; Sullivan, J. P. ; Friedmann, T. A. ; Mitchell, M. ; Ashby, C. I. H.
Pub. info.: Thin films - stresses and mechanical properties VIII : symposium held November 29-December 3, 1999, Boston, Massachusetts, U.S.A..  pp.295-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 594
4.

Conference Proceedings
Conference Proceedings
4. Tensile properties of amorphous diamond films
LaVan, D. A. ; Hohlfelder, R. J. ; Sullivan, J. P. ; Friedmann, T. A. ; Mitchell, M. ; Ashby, C. I. H.
Pub. info.: Amorphous and nanostructured carbon : sympoisum held November 29-December 2, 1999, Boston, Massachusetts, U.S.A..  pp.465-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 593
5.

Conference Proceedings
Conference Proceedings
5. Measuring Interfacial Fracture Toughness with the Blister Test
Hohlfelder, R. J. ; Luo, H. ; Vlassak, J. J. ; Chidsey, C. E. D. ; Nix, W. D.
Pub. info.: Thin films, stresses and mechanical properties VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A..  pp.115-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 436