1.

Conference Proceedings
Conference Proceedings
1. ELECTRON CHANNELLING CONTRAST IMAGING (ECCI) OF DISLOCATIONS IN BULK SPECIMENS
Czernuszka, J.T. ; Long, N.J. ; Boyes, E.D. ; Hirsch, P.B.
Pub. info.: Defects in materials : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A..  pp.289-292,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 209
2.

Conference Proceedings
Conference Proceedings
2. Electronic and mechanical properties of dislocation in semiconductors
Hirsch, P.B.
Pub. info.: Defects in semiconductors : proceedings of the Materials Research Society Annual Meeting, November 1980, Copley Plaza Hotel, Boston, Massachusetts, U.S.A..  pp.257-271,  1981.  New York.  North Holland
Title of ser.: Materials Research Society symposia proceedings
Ser. no.: 2