1.

Conference Proceedings
Conference Proceedings
1. ASSESSMENT OF SURFACE DAMAGE OF GALLIUM ARSENIDE DUE TO REACTIVE ION ETCHING
Puttock, M. S. ; Thomas, H. ; Morgan, D. V. ; Rossow, U. ; Zahn, D. R. T. ; Richter, W. ; Hilton, K. P. ; Woodward, J.
Pub. info.: Plasma processing and synthesis of materials III : symposium held April 17-19, 1990, San Francisco, California, U.S.A..  pp.255-260,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 190
2.

Conference Proceedings
Conference Proceedings
2. Effect of Plasma Etching and Sacrificial Oxidation on 4H-SiC Schottky Barrier Diodes
Morrison, D. J. ; Pidduck, A. J. ; Moore, V. ; Wilding, P. J. ; Hilton, K. P. ; Uren, M. J. ; Johnson, C. M.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.1199-1202,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(2)
3.

Conference Proceedings
Conference Proceedings
3. Surface Induced Instabilities in 4H-SiC Microwave MESFETSs
Hilton, K. P. ; Uren, M. J. ; Hayes, D. G. ; Wilding, P. J. ; Johnson, H. K. ; Guest, J. J. ; Smith, B. H.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.1251-1254,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(2)