1.

Conference Proceedings
Conference Proceedings
1. Application of Room Temperature Photoluminescence for the Characterization of Impurities and Defects in Silicon
Higgs,V. ; Chin,F. ; Wang,X.
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices and processes : joint proceedings of the symposia on ALTECH 99, satellite symposium to ESSDERC 99, Leuven, Belgium [and] the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices.  pp.21-37,  1999.  Pennington, N.J..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3895
2.

Conference Proceedings
Conference Proceedings
2. Luminescence Associated with Red-Like Defects in Czochralski Silicon
Jeyanathan,L. ; Lightowlers,E.C. ; Higgs,V. ; Davies,G.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.3  pp.1499-1504,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
3.

Conference Proceedings
Conference Proceedings
3. Carbon as a Probe of Edge-DefiBed Film-Fe.d Growth Silicon
Park,Seung-Chul ; Davies,G. ; Higgs,V. ; Sawyer,W.D.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.3  pp.1493-1498,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
4.

Conference Proceedings
Conference Proceedings
4. Influence of Cu Contamination and Hydrogenation on Recombination Activity of Misfit Dislocations in SiGe/Si Epilayers
Kittler,M. ; Ulhaq-Bouillet,C. ; Higgs,V.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.383-388,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
5.

Conference Proceedings
Conference Proceedings
5. Photoluminescence from Defects in Silicon grown by Molecular Beam Epitaxy
Lightowlers,E.C. ; Gregson,M.J. ; Higgs,V. ; Davey,S.T. ; Gibbings,C.J. ; Tuppen,C.G.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part1  pp.379-384,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41