1.

Conference Proceedings
Conference Proceedings
1. Characterization of Materials and Devices by Near-Field Scanning Optical Microscopy
Goldberg, B. B. ; Ghaemi, H. F. ; Unlu, M. S. ; Herzog, W. D.
Pub. info.: Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A..  pp.171-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 406
2.

Conference Proceedings
Conference Proceedings
2. MBE Growth and Optical Characterization of InGaN/AlGaN Multiquantum Wells
Singh, R. ; Herzog, W. D. ; Doppalapudi, D. ; Unlu, M. S. ; Goldberg, B. B. ; Moustakas, T. D.
Pub. info.: III-V nitrides : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A..  pp.185-,  1997.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 449