1.

Conference Proceedings
Conference Proceedings
1. Photoluminescence Measurements of a Beryllium-Related Deep Center in Silicon
Campion,J.D. ; McGuigan,K.G. ; Henry,M.O. ; Nazare,M.H.
Pub. info.: Shallow Impurities in Semiconductors : Proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August, 1992.  pp.177-182,  1993.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 117-118
2.

Conference Proceedings
Conference Proceedings
2. The Chemical Identification of Defect Impurities Using Radioactive Isotopes
Daly,S.E. ; Henry,M.O. ; Frehill,C.A. ; Freitag,K. ; Vianden,R. ; Rohrlack,G. ; Forkel,D.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1497-1502,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
3.

Conference Proceedings
Conference Proceedings
3. Photolumlnescence due to Zn-O Complexes in Silicon
Campion,J.D. ; Henry,M.O. ; McGuigan,K.G. ; Lightowlers,E.C.
Pub. info.: Shallow Impurities in Semiconductors : Proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August, 1992.  pp.519-520,  1993.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 117-118
4.

Conference Proceedings
Conference Proceedings
4. Oxygen Complexing with Group II Impurities in Silicon
Daly,S.E. ; McGlynn,E. ; Henry,M.O. ; Campion,J.D. ; McGuigan,K.G. ; DoCarmo,M.C. ; Nazare,M.H.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1303-1308,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
5.

Conference Proceedings
Conference Proceedings
5. Novel luminescent centres in cadmium doped silicon
Frehill,C.A. ; Henry,M.O. ; McGlynn,E. ; Daly,S.E. ; Deicher,M. ; Magerle,R. ; McGuigan,K.G. ; Safanov,A.N. ; Lightowlers,E.C.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.521-526,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
6.

Conference Proceedings
Conference Proceedings
6. The photoluminescence of Pt-implanted silicon
Alves,E. ; Bollmann,J. ; Deicher,M. ; Carmo,M.C. ; Henry,M.O. ; Knopf,M.H.A. ; Leitao,J.P. ; Magerle,R. ; McDonagh,C.J.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.473-478,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263