1.

Conference Proceedings

Conference Proceedings
Dorsch,F. ; Bluml,V. ; Schroder,M. ; Lorenzen,D. ; Hennig,P. ; Wolff,D.
Pub. info.: Laser diodes and leds in industrial, measurement, imaging, and sensors applications II : testing, packaging, and reliability of semiconductor lasers V : 26-25 January 2000, San Jose, California.  pp.42-49,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3945
2.

Conference Proceedings

Conference Proceedings
Dorsch,F. ; Hennig,P. ; Nickel,M.
Pub. info.: Fabrication, testing, and reliability of semiconductor lasers III : 29-30 January, 1998, San Jose, California.  pp.192-198,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3285
3.

Conference Proceedings

Conference Proceedings
Dorsch,F. ; Daiminger,F.X. ; Hennig,P. ; Blumel,V.
Pub. info.: Advanced high-power lasers : 1-5 November 1999, Osaka, Japan.  pp.45-53,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3889
4.

Conference Proceedings

Conference Proceedings
Hollemann,C. ; Braun,B. ; Dorsch,F. ; Hennig,P. ; Heist,P. ; Krause,U. ; Kutschki,U. ; Voelckel,H.A.
Pub. info.: Projection Displays 2000: Sixth in a Series.  pp.140-151,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3954