1.

Conference Proceedings
Conference Proceedings
1. On the motion of iron in silicon at moderate temperatures under high electric fields
Heiser,T. ; Mesli,A. ; Amroun,N.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.1  pp.173-178,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
2.

Conference Proceedings
Conference Proceedings
2. Copper related defect reactions in p-type silicon
Mesli,A. ; Heiser,T.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.1  pp.161-166,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
3.

Conference Proceedings
Conference Proceedings
3. Development of a Scanning Minority Carrier Transient Spectroscopy Method:Application to the Study of Gold Diffusion in a Silicon Bicrystal
Heiser,T. ; Mesli,A. ; Siffert,P.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part3  pp.1325-1330,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41
4.

Conference Proceedings
Conference Proceedings
4. A study of the copper-pair related centers in silicon
Istratov,A.A. ; Heiser,T. ; Hieslmair,H. ; Flink,C. ; Kruger,J. ; Weber,E.R.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.467-472,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
5.

Conference Proceedings
Conference Proceedings
5. Copper in silicon:quantitative analysis of internal and proximity gettering
McHugo,S.A. ; Heiser,T. ; Hieslmair,H. ; Flink,C. ; Weber,E.R. ; Myers,S.M. ; Petersen,G.A.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.461-466,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263