1.

Conference Proceedings
Conference Proceedings
1. Microbial life detection with minimal assumptions
Kounaves,S.P. ; Noll,R.A. ; Buehler,M.G. ; Hecht,M.H. ; Lankford,K. ; West,S.J.
Pub. info.: Instruments, methods, and missions for astrobiology IV : 29-30 July 2001, San Diego, USA.  pp.137-144,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4495
2.

Conference Proceedings
Conference Proceedings
2. Aqueous environments on contemporary Mars
Hecht,M.H.
Pub. info.: Instruments, methods, and missions for astrobiology IV : 29-30 July 2001, San Diego, USA.  pp.69-80,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4495
3.

Conference Proceedings
Conference Proceedings
3. Gas-phase silicon micromachining with xenon difluoride
Chang,F.I. ; Yeh,R. ; Lin,G. ; Chu,P.B. ; Hoffman,E.J. ; Kruglick,E.J.J. ; Pister,K.S.J. ; Hecht,M.H.
Pub. info.: Microelectronic Structures and Microelectromechanical Devices for Optical Processing and Multimedia Applications.  pp.117-128,  1995.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2641
4.

Conference Proceedings
Conference Proceedings
4. Fine pitch grids for an x-ray solar imaging spectrometer fabricated by optical lithography and XeF2 etching
Brennen,R.A. ; Hecht,M.H. ; Wiberg,D.V. ; Manion,S.J. ; Bonivert,W.D. ; Hruby,J.M. ; Pister,K.S.J. ; Kruglick,E.
Pub. info.: Microlithography and Metrology in Micromachining.  pp.226-235,  1995.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2640
5.

Conference Proceedings
Conference Proceedings
5. Fabricating subcollimating grids for an x-ray solar imaging spectrometer using LIGA techniques
Brennen,R.A. ; Hecht,M.H. ; Wiberg,D.V. ; Manion,S.J. ; Bonivert,W.D. ; Hruby,J.M. ; Scholz,M.L. ; Stowe,T.D. ; Kenny,T.W. ; Jackson,K.H. ; Malek,C.Khan
Pub. info.: Microlithography and Metrology in Micromachining.  pp.214-225,  1995.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2640