Micromachining and microfabrication process technology VI : 18-20 September 2000, Santa Clara, USA. pp.217-221, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
X-ray and micro- and nano-focusing : applications and techniques : 31 July 2001 San Diego, USA. pp.45-51, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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International Workshop on Photonics and Imaging in Biology and Medicine : 8-10 October 2001, Wuhan, China. pp.203-209, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Automatic target recognition XI : 17-20 April 2001, Orlando, USA. pp.199-208, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Design, test, and microfabrication of MEMS and MOEMS : 30 March-1 April 1999, Paris, France. Part1 pp.179-186, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Visual communications and image processing '97 : 12-14 February 1997, San Jose, California. Part1 pp.468-479, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.456-459, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Rough surface scattering and contamination : 21-23 July 1999, Denver, Colorado. pp.354-361, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Rough surface scattering and contamination : 21-23 July 1999, Denver, Colorado. pp.362-369, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Storage and retrieval for image and video databases VI : 28-30 January 1998, San Jose, California. pp.371-382, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering