1.

Conference Proceedings
Conference Proceedings
1. MEMS/NEMS mechanical characterization on different thin film materials by scanning along micro-machined cantilevers
He, J. H. ; Luo, J. K. ; Le, H. R. ; Moore, D. F.
Pub. info.: Smart sensors, actuators, and MEMS II : 9-11 May 2005, Seville, Spain.  pp.208-219,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5836
2.

Conference Proceedings
Conference Proceedings
2. Synchrotron X-ray-Absorption-Studies of Atomic-Level Alloying in Immiscible Mixtures
He, J. H. ; Schilling, P. J. ; Ma, E.
Pub. info.: Applications of synchrotron radiation techniques to materials science IV : sympoisum held April 13-17, 1998, San Francisco, California, U.S.A..  pp.347-,  1998.  Warrendale, Penn..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 524
3.

Conference Proceedings
Conference Proceedings
3. Micro-cantilever resonance sensor for biomolecular detection by using self-assembly nano-particles [6112-29]
He, J. H. ; Sun, S. Q. ; Li, Y. F. ; Ye, J. S. ; Kong, J. M. ; Cai, Y. L ; Li, C. W. H ; Lim, T. M ; Hui, W. C
Pub. info.: Microfluidics, BioMEMS, and Medical Microsystems IV.  pp.61120S-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6112
4.

Conference Proceedings
Conference Proceedings
4. A critical comparison and development of nano-mechanical characterization of MEMSjNEMS thin film materials [6111-11]
He, J. H. ; Le, H. R. ; Luo, J. K. ; Moore, Y. Q. Fu. D. F.
Pub. info.: Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V.  pp.61110T-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6111