MIPPR 2005 : Image analysis techniques : 31 October-2 November 2005, Wuhan, China. pp.60441Z-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
ICO20 : materials and nanostructures : 21-26 August, 2005, Changchun, China. pp.602908-602908, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
MIPPR 2005 : Image analysis techniques : 31 October-2 November 2005, Wuhan, China. pp.60441Q-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering