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11 results

Conference Proceedings

1. Polarized monochromatic x-ray beam extracted from laboratory electron impact source

Koike,T. ; Hayashida,K. ; Hashimoto,Y. ; Akutsu,D. ; Ohtani,M. ; Tsunemi,H.

Pub. info.:	X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany. pp.414-421, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4012

Conference Proceedings

2. Characteristics around oxygen and silicon K absorption edges of a charge-coupled device

Mori,K. ; Shouho,M. ; Katayama,H. ; Kitarnoto,S. ; Tsunemi,H. ; Hayashida,K. ; Miyata,E. ; Ohta,M. ; Kohmura,T. ; Koyama,K. ; Bautz,M.W. ; Foster,R.F. ; Kissel,S.E.

Pub. info.:	X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany. pp.539-547, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4012

Conference Proceedings

3. Quantum efficiency measurement of the x-ray CCD camera(XIS)for the｡ｦe ASTRO-E mission in the soft-x-ray band

Kohmura,T. ; Katayama,K. ; Katayama,H. ; Shouho,M. ; Tsunemi,H. ; Kitamoto,S. ; Hayashida,K. ; Miyata,E. ; Ohtani,M. ; Ohta,M. ; Yoshita,K. ; Koyama,K. ; Ricker,G.R.,Jr. ; Bautz,M.W. ; Kissel,S.E.

Pub. info.:	EUV, x-ray, and gamma-ray instrumentation for astronomy X : 21-23 July 1999 Denver, Colorado. pp.588-596, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3765

Conference Proceedings

4. Recent studies on ZnTe homoepitaxial films deposited by synchrotron-radiation-excited growth

Nishio,M. ; Hayashida,K. ; Harada,H. ; Mitsuishi,Y. ; Guo,Q. ; Ogawa,H.

Pub. info.:	Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings. pp.158-163, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4086

Conference Proceedings

5. Growth of n-type ZnTe films and formation of ohmic contacts

Hayashida,K. ; Nishio,M. ; Mitsuishi,Y. ; Guo,Q. ; Ogawa,H.

Pub. info.:	Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings. pp.248-251, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4086

Conference Proceedings

6. X-ray imaging spectrometers for Astro-E:ground calibration in the soft x-ray range

Hayashida,K. ; Kitamoto,S. ; Miyata,E. ; Tsunemi,H. ; Yoshita,K. ; Kohmura,T. ; Mori,K. ; Katayama,K. ; Katayama,H. ; Shouho,M. ; Ohta,M. ; Dotani,T. ; Ozaki,M. ; Koyama,K. ; Tsuru,T.G. ; Ricker,G.R. ; Bautz,M.W. ; Foster,R.F. ; Kissel,S.E.

Pub. info.:	X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany. pp.123-136, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4012

Conference Proceedings

7. Comparison of the charge cloud shapes in a CCD produced by x-ray photons at various energies

Hiraga,J. ; Tsunemi,H. ; Yoshita,K. ; Katayama,H. ; Hayashida,K.

Pub. info.:	EUV, x-ray, and gamma-ray instrumentation for astronomy X : 21-23 July 1999 Denver, Colorado. pp.291-298, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3765

Conference Proceedings

8. Recent studies on metalorganic vapor phase epitaxial growth of ZnTe

Nishio,M. ; Hayashida,K. ; Guo,Q. ; Ogawa,H.

Pub. info.:	Advanced photonic sensors : Technology and applications, 8-10 Novenber 2000, Beijing, China. pp.355-360, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4220

Conference Proceedings

9. Calibration of the X-ray CCD camera(XIS)for the ASTRO-E in the soft-x-ray band

Katayama,H. ; Shouho,M. ; Kohmura,T. ; Katayama,K. ; Ohta,M. ; Tsunemi,H. ; Kitamoto,S. ; Hayashida,K. ; Miyata,E. ; Yoshita,K. ; Koyama,K. ; Ricker,G.R.,Jr. ; Bautz,M.W. ; Foster,R.F. ; Doty,J.P.

Pub. info.:	EUV, x-ray, and gamma-ray instrumentation for astronomy X : 21-23 July 1999 Denver, Colorado. pp.721-728, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3765

10.

Conference Proceedings

10. X-ray detectors and calibration system for the MAXI mission

Torii,K. ; Matsuoka,M. ; Sugizaki,M. ; Tomida,H. ; Ueno,S. ; Yuan,W.-M. ; Kawai,N. ; Mihara,T. ; Yoshida,A. ; Tsunemi,H. ; Miyata,E. ; Negoro,H . ; Sakurai,I. ; Shirasaki,Y. ; Hayashida,K. ; Kitamoto,S. ; Mori,K. ; Ogata,H. ; Yoshita,K.

Pub. info.:	EUV, x-ray, and gamma-ray instrumentation for astronomy X : 21-23 July 1999 Denver, Colorado. pp.636-644, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3765

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